发明名称 ANALYSIS AND PURGING OF MATERIALS IN MANUFACTURING PROCESSES
摘要 Various systems and methods of analyzing one or more properties of a sample are provided. The system includes a self-contained purging device having a sample holder and one or more analyzers for analyzing one or more properties of the sample. The purging device is configured to remove sample contained within the sample holder when an analysis is complete. In one embodiment the purging device is configured via an air pump having a tube in fluid communication with an air inlet of the sample holder, wherein the air pump is configured to deliver pressurized air to the air inlet and thereby purge the sample. The pressurized air is localized ambient air, and substantially free of contaminants. Methods and other systems are also described and illustrated.
申请公布号 US2016041087(A1) 申请公布日期 2016.02.11
申请号 US201414454483 申请日期 2014.08.07
申请人 H2Optx Inc. 发明人 Hofmeister Rudolf J.;Ice Donald A.;Tandy Scott W.
分类号 G01N21/11;G01N21/03 主分类号 G01N21/11
代理机构 代理人
主权项 1. A system for analyzing one or more properties of a sample of a material, the system comprising: a sample holder configured to receive and retain a sample of the material during a time period corresponding to the manufacture of the material; an analyzer configured to interact with the sample contained within the sample holder and to analyze a property of the sample during the time period; and a purge device operatively connected to the sample holder, the purge device being configured to purge the sample from the sample holder in a manner such that contaminants are not introduced into the sample holder.
地址 San Jose CA US