| 摘要 |
The method involves adjusting a theoretically-defined source impedance over an input impedance of device under test (DUT), and determining acquisition of transducer power gain performances based on the impedance, input impedance, net power injected at DUT input and output power of DUT. Deviation in performance is determined based on simulated mismatching between the impedances. New source impedance is defined until iteratively obtaining a deviation less than a reference value when the deviation is higher than the value. The performances of DUT are determined based on the source impedance. An independent claim is also included for a system of determining optimal source impedance at an input of a device under test, comprising a calibrated source pull type measurement bench. |
