发明名称 半導体素子の製造方法
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device which is not likely to cause sticking, and provide a manufacturing method of the semiconductor device. <P>SOLUTION: A semiconductor device manufacturing method comprises: a step of forming an opening 1c in a substrate 1 having a catalyst layer 3 formed on one surface 1a, the opening 1c reaching from an opposite side to the one surface 1a to a rear face 3a of the catalyst layer 3; a step of forming graphene 5 on the rear face 3a of the catalyst layer 3 at the opening 1c; and a step of removing at least a part of the catalyst layer 3. A thermal treatment can be performed after forming the opening 1c and before forming the graphene 5. A protection layer can be formed on a surface of the catalyst layer 3 before forming the graphene 5. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP5857659(B2) 申请公布日期 2016.02.10
申请号 JP20110251693 申请日期 2011.11.17
申请人 株式会社デンソー 发明人 小島 永児;古市 喬干
分类号 H01L29/786;C01B31/02;H01L21/205;H01L21/336;H01L29/06;H01L51/30;H01L51/40 主分类号 H01L29/786
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