发明名称 タングステン配線半導体用洗浄剤
摘要 <P>PROBLEM TO BE SOLVED: To provide a cleaning agent for a semiconductor provided with tungsten and tungsten alloy wiring which is excellent in removal of an abrasive particle residue derived from an abrasive and removal of a metal residue on an insulating film and also excellent in tungsten corrosion inhibition in tungsten wiring. <P>SOLUTION: The cleaning agent for a semiconductor provided with tungsten and tungsten alloy wiring contains organic amine (A), quaternary ammonium hydroxide (B), a chelating agent (C), and water (W) as essential ingredients, and its pH is 7.0-14.0. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP5858597(B2) 申请公布日期 2016.02.10
申请号 JP20100017772 申请日期 2010.01.29
申请人 アドバンスド テクノロジー マテリアルズ,インコーポレイテッド 发明人 中西 睦;小路 祐吉
分类号 H01L21/304;C11D7/32;C11D17/08 主分类号 H01L21/304
代理机构 代理人
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