发明名称 |
Method for fabricating fin field effect transistors |
摘要 |
A method of fabricating a Fin field effect transistor (FinFET) includes providing a substrate having a first fin and a second fin extending above a substrate top surface, wherein the first fin has a top surface and sidewalls and the second fin has a top surface and sidewalls. The method includes forming an insulation layer between the first and second fins. The method includes forming a first gate dielectric having a first thickness covering the top surface and sidewalls of the first fin using a plasma doping process. The method includes forming a second gate dielectric covering the top surface and sidewalls of the second fin having a second thickness less than the first thickness. The method includes forming a conductive gate strip traversing over both the first gate dielectric and the second gate dielectric. |
申请公布号 |
US9257343(B2) |
申请公布日期 |
2016.02.09 |
申请号 |
US201514605540 |
申请日期 |
2015.01.26 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Wann Clement Hsingjen;Yeh Ling-Yen;Shih Chi-Yuan;Lin Yi-Tang;Chang Chih-Sheng |
分类号 |
H01L21/8234;H01L21/8238;H01L21/84;H01L27/092;H01L27/12;H01L29/66;H01L21/223 |
主分类号 |
H01L21/8234 |
代理机构 |
Haynes and Boone, LLP |
代理人 |
Haynes and Boone, LLP |
主权项 |
1. A method of fabricating a Fin field effect transistor (FinFET), the method comprising:
providing a substrate having a first fin and a second fin extending above a substrate top surface, wherein the first fin has a top surface and sidewalls and the second fin has a top surface and sidewalls; forming an insulation layer between the first and second fins extending part way up the fins from the substrate top surface; forming a photo-sensitive layer over the first and second fins; patterning the photo-sensitive layer to expose the portion of the first fin above the insulation layer and cover the second fin; forming a first gate dielectric having a first thickness covering the top surface and sidewalls of the first fin using a plasma doping process; removing the photo-sensitive layer; forming a second gate dielectric covering the top surface and sidewalls of the second fin having a second thickness less than the first thickness; and forming a conductive gate strip traversing over both the first gate dielectric and the second gate dielectric. |
地址 |
Hsin-Chu TW |