发明名称 Method for fabricating fin field effect transistors
摘要 A method of fabricating a Fin field effect transistor (FinFET) includes providing a substrate having a first fin and a second fin extending above a substrate top surface, wherein the first fin has a top surface and sidewalls and the second fin has a top surface and sidewalls. The method includes forming an insulation layer between the first and second fins. The method includes forming a first gate dielectric having a first thickness covering the top surface and sidewalls of the first fin using a plasma doping process. The method includes forming a second gate dielectric covering the top surface and sidewalls of the second fin having a second thickness less than the first thickness. The method includes forming a conductive gate strip traversing over both the first gate dielectric and the second gate dielectric.
申请公布号 US9257343(B2) 申请公布日期 2016.02.09
申请号 US201514605540 申请日期 2015.01.26
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Wann Clement Hsingjen;Yeh Ling-Yen;Shih Chi-Yuan;Lin Yi-Tang;Chang Chih-Sheng
分类号 H01L21/8234;H01L21/8238;H01L21/84;H01L27/092;H01L27/12;H01L29/66;H01L21/223 主分类号 H01L21/8234
代理机构 Haynes and Boone, LLP 代理人 Haynes and Boone, LLP
主权项 1. A method of fabricating a Fin field effect transistor (FinFET), the method comprising: providing a substrate having a first fin and a second fin extending above a substrate top surface, wherein the first fin has a top surface and sidewalls and the second fin has a top surface and sidewalls; forming an insulation layer between the first and second fins extending part way up the fins from the substrate top surface; forming a photo-sensitive layer over the first and second fins; patterning the photo-sensitive layer to expose the portion of the first fin above the insulation layer and cover the second fin; forming a first gate dielectric having a first thickness covering the top surface and sidewalls of the first fin using a plasma doping process; removing the photo-sensitive layer; forming a second gate dielectric covering the top surface and sidewalls of the second fin having a second thickness less than the first thickness; and forming a conductive gate strip traversing over both the first gate dielectric and the second gate dielectric.
地址 Hsin-Chu TW