发明名称 Method of manufacturing semiconductor device, substrate processing apparatus, and recording medium
摘要 A method of manufacturing a semiconductor device is disclosed. The method includes forming a thin film containing a predetermined element, boron, carbon, and nitrogen on a substrate by performing a cycle a predetermined number of times. The cycle includes forming a first layer containing boron and a halogen group by supplying a first precursor gas containing boron and the halogen group to the substrate; and forming a second layer containing the predetermined element, boron, carbon, and nitrogen by supplying a second precursor gas containing the predetermined element and an amino group to the substrate and modifying the first layer.
申请公布号 US9257275(B2) 申请公布日期 2016.02.09
申请号 US201414175463 申请日期 2014.02.07
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 Sano Atsushi;Hirose Yoshiro
分类号 H01L21/469;H01L21/02;C23C16/30;C23C16/455;C23C16/56 主分类号 H01L21/469
代理机构 Volpe and Koenig, P.C. 代理人 Volpe and Koenig, P.C.
主权项 1. A method of manufacturing a semiconductor device, comprising forming a thin film containing a predetermined element, boron, carbon, and nitrogen on a substrate by performing a cycle a first predetermined number of times, the cycle comprising: forming a first layer containing boron and a halogen group by supplying a first precursor gas containing boron and the halogen group to the substrate; forming a second layer containing the predetermined element, boron, carbon, and nitrogen by supplying a second precursor gas containing the predetermined element and an amino group to the substrate and modifying the first layer; andsupplying a reaction gas to the substrate, the reaction gas being different from the first precursor gas and the second precursor gas.
地址 Tokyo JP