发明名称 |
Method of manufacturing semiconductor device, substrate processing apparatus, and recording medium |
摘要 |
A method of manufacturing a semiconductor device is disclosed. The method includes forming a thin film containing a predetermined element, boron, carbon, and nitrogen on a substrate by performing a cycle a predetermined number of times. The cycle includes forming a first layer containing boron and a halogen group by supplying a first precursor gas containing boron and the halogen group to the substrate; and forming a second layer containing the predetermined element, boron, carbon, and nitrogen by supplying a second precursor gas containing the predetermined element and an amino group to the substrate and modifying the first layer. |
申请公布号 |
US9257275(B2) |
申请公布日期 |
2016.02.09 |
申请号 |
US201414175463 |
申请日期 |
2014.02.07 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
Sano Atsushi;Hirose Yoshiro |
分类号 |
H01L21/469;H01L21/02;C23C16/30;C23C16/455;C23C16/56 |
主分类号 |
H01L21/469 |
代理机构 |
Volpe and Koenig, P.C. |
代理人 |
Volpe and Koenig, P.C. |
主权项 |
1. A method of manufacturing a semiconductor device, comprising forming a thin film containing a predetermined element, boron, carbon, and nitrogen on a substrate by performing a cycle a first predetermined number of times, the cycle comprising:
forming a first layer containing boron and a halogen group by supplying a first precursor gas containing boron and the halogen group to the substrate; forming a second layer containing the predetermined element, boron, carbon, and nitrogen by supplying a second precursor gas containing the predetermined element and an amino group to the substrate and modifying the first layer; andsupplying a reaction gas to the substrate, the reaction gas being different from the first precursor gas and the second precursor gas. |
地址 |
Tokyo JP |