发明名称 レジスト組成物、レジストパターン形成方法及び高分子化合物
摘要 A resist composition including a base component (A) which exhibits changed solubility in a developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, the base component (A) containing a polymeric compound (A1) having a structural unit (a5) represented by general formula (a5-0) shown below (R1 represents a sulfur atom or an oxygen atom; R2 represents a single bond or a divalent linking group; and Y represents an aromatic hydrocarbon group or an aliphatic hydrocarbon group having a polycyclic group, provided that the aromatic hydrocarbon group or the aliphatic hydrocarbon may have a carbon atom or a hydrogen atom thereof substituted with a substituent.
申请公布号 JP5856441(B2) 申请公布日期 2016.02.09
申请号 JP20110245904 申请日期 2011.11.09
申请人 東京応化工業株式会社 发明人 高木 大地;塩野 大寿;内海 義之;海保 貴昭
分类号 G03F7/039;C08F20/58;G03F7/004 主分类号 G03F7/039
代理机构 代理人
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