发明名称 Canary circuit with passgate transistor variation
摘要 A canary circuit with passgate transistor variation is described herein. The canary circuit includes a memory canary circuit that has a plurality of bitcells. Each bitcell has at least a passgate transistor that is driven by a wordline voltage. The canary circuit further includes a regulator circuit that outputs a wordline voltage that accounts for a predetermined offset of a threshold voltage of the passgate transistor. In an embodiment, the regulator circuit is a subtractor circuit that generates the wordline voltage from a reference voltage based in part on the threshold voltage variation of the passgate transistor.
申请公布号 US9257199(B2) 申请公布日期 2016.02.09
申请号 US201313949343 申请日期 2013.07.24
申请人 Advanced Micro Devices, Inc. 发明人 Schreiber Russell
分类号 G11C29/02;G11C8/08;G11C11/418;G11C29/12 主分类号 G11C29/02
代理机构 Volpe and Koenig, P.C. 代理人 Volpe and Koenig, P.C.
主权项 1. An apparatus, comprising: a memory canary circuit including a plurality of bitcells, each bitcell having at least one passgate transistor; a regulator circuit configured to output a wordline voltage that accounts for a predetermined offset from a threshold voltage of the passgate transistor, wherein the passgate transistor is driven by the wordline voltage; and a test circuit configured to determine memory canary circuit failure on a condition that a number of read/write errors on the memory canary circuit exceed a predetermined threshold, wherein an operating frequency and voltage are altered based on the memory canary circuit failure determination.
地址 Sunnyvale CA US
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