发明名称 |
Canary circuit with passgate transistor variation |
摘要 |
A canary circuit with passgate transistor variation is described herein. The canary circuit includes a memory canary circuit that has a plurality of bitcells. Each bitcell has at least a passgate transistor that is driven by a wordline voltage. The canary circuit further includes a regulator circuit that outputs a wordline voltage that accounts for a predetermined offset of a threshold voltage of the passgate transistor. In an embodiment, the regulator circuit is a subtractor circuit that generates the wordline voltage from a reference voltage based in part on the threshold voltage variation of the passgate transistor. |
申请公布号 |
US9257199(B2) |
申请公布日期 |
2016.02.09 |
申请号 |
US201313949343 |
申请日期 |
2013.07.24 |
申请人 |
Advanced Micro Devices, Inc. |
发明人 |
Schreiber Russell |
分类号 |
G11C29/02;G11C8/08;G11C11/418;G11C29/12 |
主分类号 |
G11C29/02 |
代理机构 |
Volpe and Koenig, P.C. |
代理人 |
Volpe and Koenig, P.C. |
主权项 |
1. An apparatus, comprising:
a memory canary circuit including a plurality of bitcells, each bitcell having at least one passgate transistor; a regulator circuit configured to output a wordline voltage that accounts for a predetermined offset from a threshold voltage of the passgate transistor, wherein the passgate transistor is driven by the wordline voltage; and a test circuit configured to determine memory canary circuit failure on a condition that a number of read/write errors on the memory canary circuit exceed a predetermined threshold, wherein an operating frequency and voltage are altered based on the memory canary circuit failure determination. |
地址 |
Sunnyvale CA US |