发明名称 Method of testing secondary battery
摘要 A method of testing a secondary battery includes first to fourth steps. At the first step, the secondary battery after manufacture is charged to a first voltage. At the second step, a second voltage lower than the first voltage is set as a target voltage and discharge or charge is performed in a constant-current constant-voltage mode before the secondary battery is left standing. At the third step, the open circuit voltage of the secondary battery is measured before and after the secondary battery is left standing. At the fourth step, it is determined whether the secondary battery is a conforming item or not based on the difference in the open circuit voltage before and after the secondary battery is left standing.
申请公布号 US9255972(B2) 申请公布日期 2016.02.09
申请号 US201114001294 申请日期 2011.03.02
申请人 Toyota Jidosha Kabushiki Kaisha 发明人 Hojo Katsuyuki;Kojima Hisanao;Ikeda Hiroaki;Fujimaki Hisataka
分类号 G01N27/416;G01R31/36;H01M10/44;H01M10/04;H01M10/30;H01M10/48 主分类号 G01N27/416
代理机构 Finnegan, Henderson, Farabow, Garrett & Dunner, LLP 代理人 Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
主权项 1. A method of testing a secondary battery comprising: a first step of charging the secondary battery after manufacture to a first voltage in a constant-current mode; a second step of setting a second voltage lower than the first voltage as a target voltage and performing discharge or charge in a constant-current constant-voltage mode, the second step being performed before the secondary battery is left standing; a third step of measuring a first open circuit voltage of the secondary battery when starting to leave the secondary battery standing and a second open circuit voltage of the secondary battery when a predetermined time is elapsed after starting to leave the secondary battery standing; and a fourth step of determining whether the secondary battery is a conforming item or not based on a difference between the first open circuit voltage and the second open circuit voltage.
地址 Toyota-shi, Aichi JP