发明名称 |
Synchronized debug information generation |
摘要 |
In an approach for determining a location of failure between interconnects/controller, a computer collects debug information simultaneously at a plurality of nodes coupled to an interconnect. Subsequent to collecting debug information, the computer analyzes the debug information collected simultaneously thereby determining which end of the interconnect caused the failure. |
申请公布号 |
US9256489(B2) |
申请公布日期 |
2016.02.09 |
申请号 |
US201314066722 |
申请日期 |
2013.10.30 |
申请人 |
International Business Machines Corporation |
发明人 |
Mahajan Ajay K.;Sainath Venkatesh;Subbanna Vishwanatha |
分类号 |
G06F11/07 |
主分类号 |
G06F11/07 |
代理机构 |
|
代理人 |
McCarthy Maeve |
主权项 |
1. A computer program product for determining a location of failure between interconnects/controller, the computer program product comprising:
one or more computer-readable storage device and program instructions stored on the one or more computer-readable storage device, the stored program instructions comprising: program instructions to collect debug information simultaneously at a plurality of nodes coupled to an interconnect; and program instructions to analyze the debug information collected simultaneously thereby determining which end of the interconnect caused the failure. |
地址 |
Armonk NY US |