发明名称 |
Projector-camera misalignment correction for structured light systems |
摘要 |
A method of misalignment correction in a structured light device is provided that includes extracting features from a first captured image of a scene, wherein the first captured image is captured by an imaging sensor component of the structured light device, and wherein the first captured image includes a pattern projected into the scene by a projector component of the structured light device, matching the features of the first captured image to predetermined features of a pattern image corresponding to the projected pattern to generate a dataset of matching features, determining values of alignment correction parameters of an image alignment transformation model using the dataset of matching features, and applying the image alignment transformation model to a second captured image using the determined alignment correction parameter values. |
申请公布号 |
US9256943(B2) |
申请公布日期 |
2016.02.09 |
申请号 |
US201414228236 |
申请日期 |
2014.03.27 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
Appia Vikram VijayanBabu;Pekkucuksen Ibrahim Ethem |
分类号 |
G06K9/00;G06K9/32;G06T7/00 |
主分类号 |
G06K9/00 |
代理机构 |
|
代理人 |
Albin Gregory J.;Cimino Frank D. |
主权项 |
1. A method of misalignment correction in a structured light device, the method comprising:
extracting features from a first captured image of a scene, wherein the first captured image is captured by an imaging sensor component of the structured light device, and wherein the first captured image comprises a pattern projected into the scene by a projector component of the structured light device; matching the features of the first captured image to predetermined features of a pattern image corresponding to the projected pattern to generate a dataset of matching features; determining values of alignment correction parameters of an image alignment transformation model using the dataset of matching features; and applying the image alignment transformation model to a second captured image using the determined alignment correction parameter values. |
地址 |
Dallas TX US |