发明名称 CONTROL METHOD OF SUBSTRATE PROCESSING DEVICE, SUBSTRATE PROCESSING DEVICE, AND STORAGE MEDIUM
摘要 PROBLEM TO BE SOLVED: To enhance an unnecessary object removal performance, while suppressing adhesion of particles generated from a brush to a substrate.SOLUTION: In a control method of a substrate processing device 109 including a substrate holding section 202 for rotating a substrate 105 while holding, a brush 302 for processing the substrate 105 by coming into contact therewith, and a cleaning solution supply section 204 supplying a cleaning solution for the substrate, pressing force of the brush 302 to the substrate 109 is controlled by dividing the processing region of the substrate 105 into a first region closest to the substrate center side where the cleaning solution is supplied from the cleaning solution supply section 204, a second region, and a third region closest to the substrate rim side, sequentially from the center position of the substrate, and the pressing force of the second region is set larger than that of the first region and third region.SELECTED DRAWING: Figure 7
申请公布号 JP2016025259(A) 申请公布日期 2016.02.08
申请号 JP20140149395 申请日期 2014.07.23
申请人 TOKYO ELECTRON LTD 发明人 KAMITO SHINGO;NISHIKIDO SHUICHI;HIDAKA SHOICHIRO;OBARA TAKANORI
分类号 H01L21/304 主分类号 H01L21/304
代理机构 代理人
主权项
地址