| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device allowing connection check of wiring to which a capacitor is series connected, and a test method of the same.SOLUTION: A semiconductor integrated circuit device comprises: a first semiconductor integrated circuit; a second semiconductor integrated circuit; and wiring which connects a first external pin of the first semiconductor integrated circuit and a second external pin of the second semiconductor integrated circuit, and to which a capacitor is series connected. The first semiconductor integrated circuit includes a first boundary scan cell connected to the first external pin, and a first controller setting data to the first boundary scan cell. The second semiconductor integrated circuit includes: a second boundary scan cell connected to the second external pin; a flip flop taking input data from the second external pin at a timing before a capture data register state; and a second controller capturing the input data took into the flip flop to the second boundary scan cell at rising of a TCK of the capture data register state.SELECTED DRAWING: Figure 1 |
