发明名称 |
SEMICONDUCTOR DEVICES |
摘要 |
Provided are semiconductor devices. A semiconductor device includes a first well formed in a substrate; an element isolation layer formed on the first well; a second well formed in the first well on a first side of the element isolation layer; a third well formed in the second well, the third well has a higher concentration of impurities than the second well; a first electrode electrically connected to the third well; a fourth well formed in the first well on a second side of the element isolation layer; a fifth well formed in the fourth well, the fifth well has a different conductivity type from the fourth well; a second electrode electrically connected to the fifth well; and a sixth well overlapping the fourth well, the sixth well has a lower concentration of impurities than the fourth well. |
申请公布号 |
US2016035905(A1) |
申请公布日期 |
2016.02.04 |
申请号 |
US201514714405 |
申请日期 |
2015.05.18 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Yoo Jae-Hyun |
分类号 |
H01L29/866;H01L29/06;H01L29/36;H01L27/02 |
主分类号 |
H01L29/866 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a first well formed in a substrate; an element isolation layer that is on the first well; a second well that is in the first well on a first side of the element isolation layer; a third well that is in the second well, wherein the third well has a higher concentration of impurities than the second well; a first electrode that is electrically connected to the third well; a fourth well that is in the first well on a second side of the element isolation layer; a fifth well that is in the fourth well, wherein the fifth well has a different conductivity type from the fourth well; a second electrode that is electrically connected to the fifth well; and a sixth well that overlaps the fourth well, wherein the sixth well has a lower concentration of impurities than the fourth well. |
地址 |
Suwon-si KR |