发明名称 FUNCTIONALIZED GRIDS FOR LOCATING AND IMAGING BIOLOGICAL SPECIMENS AND METHODS OF USING THE SAME
摘要 A functionalized specimen support for use in charged particle microscopy is provided that includes a specimen support surface configured to support specimens during an interrogation of the specimens with a charged particle microscope, the specimen support surface having functionalized sites, each functionalized site configured to maintain position of a portion of one of the specimens at the functionalized site by way of attachment, attraction, or a combination thereof.
申请公布号 US2016032281(A1) 申请公布日期 2016.02.04
申请号 US201414449088 申请日期 2014.07.31
申请人 FEI Company 发明人 Utlaut Mark;Parker N. William
分类号 C12N15/10;C12Q1/68 主分类号 C12N15/10
代理机构 代理人
主权项 1. A functionalized specimen support for use in charged particle microscopy, the functionalized specimen support comprising a specimen support surface configured to support a specimen during an interrogation of the specimen with a charged particle microscope, the specimen support surface comprising a functionalized site configured to maintain a position of the specimen at the functionalized site by way of attachment, attraction, or a combination thereof.
地址 Hillsboro OR US