发明名称 RESISTANCE VARIABLE MEMORY CELL STRUCTURES AND METHODS
摘要 Resistance variable memory cell structures and methods are described herein. A number of embodiments include a first resistance variable memory cell comprising a number of resistance variable materials in a super-lattice structure and a second resistance variable memory cell comprising the number of resistance variable materials in a homogeneous structure.
申请公布号 US2016035791(A1) 申请公布日期 2016.02.04
申请号 US201514877006 申请日期 2015.10.07
申请人 Micron Technology, Inc. 发明人 Joshi Sachin V.;Gealy F. Daniel
分类号 H01L27/24;H01L45/00 主分类号 H01L27/24
代理机构 代理人
主权项
地址 Boise ID US