发明名称 FIXED VOLTAGE SENSING IN A MEMORY DEVICE
摘要 Methods for sensing ferroelectric memory devices and apparatuses using the same have been disclosed. One such apparatus includes a ferroelectric memory cell coupled to a data line, a reference capacitance, and a common node coupled between the data line and the reference capacitance. A current mirror circuit is coupled to the data line and the reference capacitance. During a sense operation, the common node is configured to be at a fixed voltage and the current mirror circuit is configured to mirror displacement current from the reference capacitance to the ferroelectric memory cell.
申请公布号 US2016035406(A1) 申请公布日期 2016.02.04
申请号 US201414451071 申请日期 2014.08.04
申请人 Micron Technology, Inc. 发明人 Johnson Adam D.
分类号 G11C11/22 主分类号 G11C11/22
代理机构 代理人
主权项 1. An apparatus comprising: a ferroelectric memory cell coupled to a data line; a reference capacitance; a common node coupled between the data line and the reference capacitance; and a current mirror circuit coupled to the data line and to the reference capacitance, wherein the common node is configured to be at a fixed voltage for sensing the memory cell and the current mirror circuit is configured to mirror displacement current from the reference capacitance to the ferroelectric memory cell.
地址 Boise ID US