发明名称 |
FIXED VOLTAGE SENSING IN A MEMORY DEVICE |
摘要 |
Methods for sensing ferroelectric memory devices and apparatuses using the same have been disclosed. One such apparatus includes a ferroelectric memory cell coupled to a data line, a reference capacitance, and a common node coupled between the data line and the reference capacitance. A current mirror circuit is coupled to the data line and the reference capacitance. During a sense operation, the common node is configured to be at a fixed voltage and the current mirror circuit is configured to mirror displacement current from the reference capacitance to the ferroelectric memory cell. |
申请公布号 |
US2016035406(A1) |
申请公布日期 |
2016.02.04 |
申请号 |
US201414451071 |
申请日期 |
2014.08.04 |
申请人 |
Micron Technology, Inc. |
发明人 |
Johnson Adam D. |
分类号 |
G11C11/22 |
主分类号 |
G11C11/22 |
代理机构 |
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代理人 |
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主权项 |
1. An apparatus comprising:
a ferroelectric memory cell coupled to a data line; a reference capacitance; a common node coupled between the data line and the reference capacitance; and a current mirror circuit coupled to the data line and to the reference capacitance, wherein the common node is configured to be at a fixed voltage for sensing the memory cell and the current mirror circuit is configured to mirror displacement current from the reference capacitance to the ferroelectric memory cell. |
地址 |
Boise ID US |