发明名称 AUTOMATIC ANALYSIS DEVICE
摘要 The present invention achieves an automatic analysis device which has a probe guard for which the range of motion for accessing a specimen container installation section is small and which can be moved without being removed from a specimen installation section. The directions of movement of a probe guard (26) are the vertical direction of a specimen container erection mechanism (1) and the horizontal direction within an upper region of the specimen container erection mechanism (1), and a specimen container can be accessed without the need to move the probe guard (26) to outside the upper region of the specimen container erection mechanism (1). Accordingly, it is possible to achieve an automatic analysis device which has a probe guard for which the range of motion for accessing a specimen container installation section is small and which can be moved without being removed from a specimen installation section.
申请公布号 WO2016017294(A1) 申请公布日期 2016.02.04
申请号 WO2015JP66765 申请日期 2015.06.10
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 SETOMARU TAKESHI;CHIBA HIDEYASU
分类号 G01N35/02;G01N35/10 主分类号 G01N35/02
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