发明名称 |
PACKAGE INSPECTION SYSTEM |
摘要 |
A package inspection system is provided, where an electromagnetic-wave detection part is hardly affected by illumination light for optical detection. Below a gap 6c of a conveyor mechanism 6 for conveying a package, provided are an X-ray sensor 13 for detecting X rays transmitted through the package and an illumination part 16 for applying illumination light to the gap 6c. The X-ray sensor 13 and the illumination part 16 are separated from each other by a partition 42. A light-shielding member 43 is placed in the path of X-ray incidence to the X-ray sensor 13. The light-shielding member 43 is formed of a material that allows passage of the X rays but does not allow passage of the illumination light and is hardly deteriorated by irradiation of the X rays, e.g., a carbon sheet. |
申请公布号 |
US2016033404(A1) |
申请公布日期 |
2016.02.04 |
申请号 |
US201314418895 |
申请日期 |
2013.10.03 |
申请人 |
SYSTEM SQUARE INC. |
发明人 |
Suzuki Atsushi;Ikeda Noriaki |
分类号 |
G01N21/59;G01V5/00;G01V11/00 |
主分类号 |
G01N21/59 |
代理机构 |
|
代理人 |
|
主权项 |
1. A package inspection system comprising:
a conveyor mechanism for conveying a package having a content in a wrapping; an irradiation part for irradiating the package with an X ray or a terahertz wave; an electromagnetic-wave detection part for detecting the X ray or terahertz wave transmitted through the package; an illumination part for illuminating the package; and an optical detection part for taking an optical image of the package, a partition being provided between the electromagnetic-wave detection part and the illumination part, the partition having a light-shielding member configured to allow passage of the X ray or terahertz wave but block or reduce the light emitted from the illumination part, at least in a path through which the X ray or terahertz wave enter the electromagnetic-wave detection part. |
地址 |
Nagaoka-shi, Niigata JP |