| 摘要 |
PROBLEM TO BE SOLVED: To allow for flexibly testing computer embedded devices.SOLUTION: A computer embedded device test system comprises: a plurality of software-implemented layers that are classified into a plurality of hierarchies, each layer being configured to provide services to higher hierarchies; a device emulator 162V that emulates hardware; an information processing device 4 that executes a virtual computer embedded device 1V having the layers and an application program interface 161V of the device emulator; and test means that accesses the virtual computer embedded device 1V via the application program interface 161V using an arbitrary layer test code 42.SELECTED DRAWING: Figure 5 |
