发明名称 |
CMOS STRUCTURE WITH BENEFICIAL NMOS AND PMOS BAND OFFSETS |
摘要 |
A CMOS structure with beneficial nMOS and pMOS band offsets is disclosed. A first silicon germanium layer is formed on a semiconductor substrate. A second silicon germanium layer is formed on the first silicon germanium layer. The second silicon germanium layer has a higher germanium percentage than the first silicon germanium layer. Furthermore, the germanium concentration of the two layers is selected such that there is a beneficial band offset for both N-type field effect transistors and P-type field effect transistors in a CMOS structure. |
申请公布号 |
US2016035727(A1) |
申请公布日期 |
2016.02.04 |
申请号 |
US201414446695 |
申请日期 |
2014.07.30 |
申请人 |
GLOBALFOUNDRIES Inc. |
发明人 |
Brunco David P. |
分类号 |
H01L27/092;H01L29/161;H01L21/8238;H01L29/78;H01L21/02;H01L29/06;H01L29/36 |
主分类号 |
H01L27/092 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor structure comprising:
a semiconductor substrate; a first silicon germanium layer disposed on the semiconductor substrate; a second silicon germanium layer disposed on the first silicon germanium layer; anda plurality of shallow trench isolation regions formed in the second silicon germanium layer and partially into the first silicon germanium layer; wherein the first silicon germanium layer has a first germanium concentration, and wherein the second silicon germanium layer has a second germanium concentration, and wherein the second germanium concentration is greater than the first germanium concentration. |
地址 |
Grand Cayman KY |