发明名称 CMOS STRUCTURE WITH BENEFICIAL NMOS AND PMOS BAND OFFSETS
摘要 A CMOS structure with beneficial nMOS and pMOS band offsets is disclosed. A first silicon germanium layer is formed on a semiconductor substrate. A second silicon germanium layer is formed on the first silicon germanium layer. The second silicon germanium layer has a higher germanium percentage than the first silicon germanium layer. Furthermore, the germanium concentration of the two layers is selected such that there is a beneficial band offset for both N-type field effect transistors and P-type field effect transistors in a CMOS structure.
申请公布号 US2016035727(A1) 申请公布日期 2016.02.04
申请号 US201414446695 申请日期 2014.07.30
申请人 GLOBALFOUNDRIES Inc. 发明人 Brunco David P.
分类号 H01L27/092;H01L29/161;H01L21/8238;H01L29/78;H01L21/02;H01L29/06;H01L29/36 主分类号 H01L27/092
代理机构 代理人
主权项 1. A semiconductor structure comprising: a semiconductor substrate; a first silicon germanium layer disposed on the semiconductor substrate; a second silicon germanium layer disposed on the first silicon germanium layer; anda plurality of shallow trench isolation regions formed in the second silicon germanium layer and partially into the first silicon germanium layer; wherein the first silicon germanium layer has a first germanium concentration, and wherein the second silicon germanium layer has a second germanium concentration, and wherein the second germanium concentration is greater than the first germanium concentration.
地址 Grand Cayman KY