Measurement device for the three-dimensional optical measurement of objects with a topometric sensor and use of a multi-laser-chip device

摘要

A measurement device for the three-dimensional optical measurement of objects with a topometric sensor includes at least one projection unit for projecting a pattern onto an object and at least one image recording unit for recording the pattern that is scattered back from the object. The projection unit has a laser-light source and a pattern generator to which the laser light radiation from the laser-light source can be supplied. The laser-light source has at least one multi-laser-chip device having a plurality of laser diode chips in a common multi-laser-chip package, wherein the laser diode chips are attached to a mounting surface of the multi-laser-chip package and are in thermal communication with the multi-laser-chip package via the mounting surface.

主权项

1. A measurement device for the three-dimensional optical measurement of objects with a topometric sensor, comprising:
at least one projection unit for projecting a projection pattern onto an object; at least one image recording unit for recording a scattered pattern that is scattered back from the object, wherein the projection unit has a laser-light source and a pattern generator to which laser light radiation from the laser-light source is supplied, wherein the laser-light source has at least one multi-laser-chip device having a plurality of laser diode chips in a common multi-laser-chip package, wherein the laser diode chips are attached to a mounting surface of the multi-laser-chip package and are in thermal communication with the multi-laser-chip package via a mounting surface.