发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
Conventional semiconductor devices are problematic in that an operation cannot be continued in the event of a failure of one of CPU cores performing a lock step operation and, as a result, reliability cannot be improved. The semiconductor device according to the present invention includes a computing unit including a first CPU core and a second CPU core that perform a lock step operation, wherein the first CPU core 11 and the second CPU core 12 respectively diagnose failures of internal logic circuits, and a sequence control circuit switches the CPU core that outputs data to a shared resource, in the computing unit based on the diagnose result. |
申请公布号 |
US2016034368(A1) |
申请公布日期 |
2016.02.04 |
申请号 |
US201514801825 |
申请日期 |
2015.07.17 |
申请人 |
Renesas Electronics Corporation |
发明人 |
Nishii Osamu;Takada Kiwamu |
分类号 |
G06F11/20 |
主分类号 |
G06F11/20 |
代理机构 |
|
代理人 |
|
主权项 |
1. A semiconductor device comprising:
a first computing element and a second computing element that perform a lock step operation in which the same process is executed by multiplexing and that respectively output diagnostic information indicating a presence or absence of a failure occurring in an internal logic circuit; a shared resource that is shared by the first computing element and the second computing element; a selector that selects either one of output data of the first computing element and output data of the second computing element based on a selection signal, and outputs the selected output data to the shared resource; and a sequence control circuit that outputs the selection signal so as to cause the selector to select output data of a normal computing element in place of a computing element in which a failure is determined to have occurred based on the diagnostic information. |
地址 |
Kawasaki-shi JP |