发明名称 STRESS RELIEVING SEMICONDUCTOR LAYER
摘要 A semiconductor structure, such as a group III nitride-based semiconductor structure is provided. The semiconductor structure includes a cavity containing semiconductor layer. The cavity containing semiconductor layer can have a thickness greater than two monolayers and a multiple cavities. The cavities can have a characteristic size of at least one nanometer and a characteristic separation of at least five nanometers.
申请公布号 WO2014179523(A3) 申请公布日期 2016.02.04
申请号 WO2014US36291 申请日期 2014.05.01
申请人 SENSOR ELECTRONIC TECHNOLOGY, INC. 发明人 SHATALOV, MAXIM, S.;YANG, JINWEI;SUN, WENHONG;JAIN, RAKESH;SHUR, MICHAEL;GASKA, REMIGIJUS
分类号 H01L33/00;H01L29/06 主分类号 H01L33/00
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