发明名称 |
METHODS OF FORMING TRANSISTORS WITH RETROGRADE WELLS IN CMOS APPLICATIONS AND THE RESULTING DEVICE STRUCTURES |
摘要 |
One illustrative method disclosed herein includes performing a first plurality of epitaxial deposition processes to form a first plurality of semiconductor materials selectively above the N-active region while masking the P-active region, performing a second plurality of epitaxial deposition processes to form a second plurality of semiconductor materials selectively above the P-active region while masking the N-active region, forming an N-type transistor in and above the N-active region and forming a P-type transistor in and above the P-active region. |
申请公布号 |
US2016035630(A1) |
申请公布日期 |
2016.02.04 |
申请号 |
US201514882640 |
申请日期 |
2015.10.14 |
申请人 |
GLOBALFOUNDRIES Inc. |
发明人 |
Vakada Vara G. Reddy;Kang Laegu;Ganz Michael;Qi Yi;Khanna Puneet;Samavedam Srikanth Balaji;Vemula Sri Charan;Eller Manfred |
分类号 |
H01L21/8238;H01L27/092 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
1. A method, comprising:
forming an N-active region and a P-active region in a semiconductor substrate; performing a common etching process to form recesses in said N-active region and said P-active region such that said N-active region and said P-active region have recessed surfaces; performing a first plurality of epitaxial deposition processes to form a first plurality of semiconductor materials selectively above said N-active region while masking said P-active region, wherein performing said first plurality of epitaxial deposition processes comprises forming a layer of silicon-carbon on said recessed surface of said N-active region and forming a first layer of a first semiconductor material on said layer of silicon-carbon; performing a second plurality of epitaxial deposition processes to form a second plurality of semiconductor materials selectively above said P-active region while masking said N-active region, wherein performing said second plurality of epitaxial deposition processes comprises forming a second layer of said first semiconductor material on said recessed surface of said P-active region and forming a layer of a second semiconductor material on said second layer of said first semiconductor material, wherein said first semiconductor material is a different semiconductor material from said second semiconductor material; forming an N-type transistor in and above said N-active region; and forming a P-type transistor in and above said P-active region. |
地址 |
Grand Cayman KY |