发明名称 レジスト組成物及びレジストパターン形成方法
摘要 PROBLEM TO BE SOLVED: To provide: a resist composition excellent in coating properties, resolution, and lithographic properties; and a method of forming a resist pattern using the resist composition.SOLUTION: A resist composition includes a base component (A) whose solubility in a developing solution is changed by the action of an acid, an acid-generator component (B) which generates an acid upon exposure, and an organic solvent component (S). The organic solvent component (S) contains an organic solvent (S1) comprising a compound represented by the specified general formula (s-1). The base component (A) includes a resin component (A0) having a constitutional unit (a2) including either a cyclic group containing -SO-, a cyclic group containing a carbonate, or a cyclic group containing a lactone. (In the formula, X represents a single bond or an alkylene group having 1 to 3 carbon atoms, and n represents an integer from 0 to 3.)
申请公布号 JP5851282(B2) 申请公布日期 2016.02.03
申请号 JP20120044693 申请日期 2012.02.29
申请人 東京応化工業株式会社 发明人 本池 直人
分类号 G03F7/004;C07D303/14;C07D305/06;C07D307/00;C07D307/12;C07D307/20;C07D307/93;C07D309/06;C07D313/06;C07D327/02;C07D493/18;C08F20/38;G03F7/039 主分类号 G03F7/004
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