发明名称 プラズマ処理装置
摘要 There is provided a plasma processing apparatus including a processing chamber having a dielectric window; a substrate holding unit for holding thereon a processing target substrate within the processing chamber; a processing gas supply unit configured to supply a processing gas into the processing chamber in order to perform a plasma process on the substrate; a RF antenna provided outside the dielectric window in order to generate plasma of the processing gas within the processing chamber by inductive coupling; and a high frequency power supply unit configured to supply a high frequency power having a frequency for generating a high frequency electric discharge of the processing gas. Here, the RF antenna includes a plurality of coil segments that are arranged along a loop having a preset shape and a preset size while electrically connected in parallel to each other.
申请公布号 JP5851682(B2) 申请公布日期 2016.02.03
申请号 JP20100216844 申请日期 2010.09.28
申请人 東京エレクトロン株式会社 发明人 山澤 陽平
分类号 H01L21/3065;H01L21/31;H05H1/46 主分类号 H01L21/3065
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