发明名称 PORTABLE STRUCTURED LIGHT MEASUREMENT MODULE/APPARATUS WITH PATTERN SHIFTING DEVICE INCORPORATING A FIXED-PATTERN OPTIC FOR ILLUMINATING A SUBJECT-UNDER-TEST
摘要 A surface measurement module for 3-D image acquisition of a subject-under-inspection. The module having: (a) a casing to house a pattern shifting device having a fixed-pattern optic through which light from a light source is passed, an output of the pattern shifting device being directed at a polarizing beam splitter and the polarized output of the splitter directed through a lens assembly comprising at least one lens element; (b) a reflector to direct the polarized output exiting the lens assembly, to illuminate a surface of the subject-under-inspection; (c) a scattered light illumination off the surface is directed back through the lens assembly for capture by an image sensor; and (d) the casing also housing the polarizing beam splitter, the lens assembly, and the image sensor. The output of the fixed-pattern optic comprises a multi-frequency pattern. The pattern shifting device may be a linear or rotating type.
申请公布号 EP2979059(A1) 申请公布日期 2016.02.03
申请号 EP20130880242 申请日期 2013.03.27
申请人 SEIKOWAVE INC. 发明人 BELLIS, MATTHEW, W.;LAU, DANIEL, L.;HARA, HIDEO
分类号 G01B11/24;G02B27/22 主分类号 G01B11/24
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