发明名称 |
HARDMASK COMPOSITION AND METHOD OF FORMING PATTERNING USING THE HARDMASK COMPOSITION |
摘要 |
Provided are a hard mask composition with excellent etch resistance and a method for forming patterns using the same. The hard mask composition comprises: one or more selected from the group consisting of a two-dimensional layered nanostructure and a precursor thereof; and a solvent, wherein a content of one or more selected from the group consisting of the two-dimensional layered nanostructure and the precursor thereof is 0.01 to 40 parts by weight with respect to 100 parts by weight of the hard mask composition. |
申请公布号 |
KR20160012804(A) |
申请公布日期 |
2016.02.03 |
申请号 |
KR20140095007 |
申请日期 |
2014.07.25 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SHIN, HYEON JIN;KIM, SANG WON;PARK, SEONG JUN |
分类号 |
G03F7/11;G03F7/00;H01L21/027 |
主分类号 |
G03F7/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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