发明名称 HARDMASK COMPOSITION AND METHOD OF FORMING PATTERNING USING THE HARDMASK COMPOSITION
摘要 Provided are a hard mask composition with excellent etch resistance and a method for forming patterns using the same. The hard mask composition comprises: one or more selected from the group consisting of a two-dimensional layered nanostructure and a precursor thereof; and a solvent, wherein a content of one or more selected from the group consisting of the two-dimensional layered nanostructure and the precursor thereof is 0.01 to 40 parts by weight with respect to 100 parts by weight of the hard mask composition.
申请公布号 KR20160012804(A) 申请公布日期 2016.02.03
申请号 KR20140095007 申请日期 2014.07.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIN, HYEON JIN;KIM, SANG WON;PARK, SEONG JUN
分类号 G03F7/11;G03F7/00;H01L21/027 主分类号 G03F7/11
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