发明名称 Substrate dividing method
摘要 A substrate dividing method which can thin and divide a substrate while preventing chipping and cracking from occurring. This substrate dividing method comprises the steps of irradiating a semiconductor substrate 1 having a front face 3 formed with functional devices 19 with laser light while positioning a light-converging point within the substrate, so as to form a modified region including a molten processed region due to multiphoton absorption within the semiconductor substrate 1, and causing the modified region including the molten processed region to form a starting point region for cutting; and grinding a rear face 21 of the semiconductor substrate 1 after the step of forming the starting point region for cutting such that the semiconductor substrate 1 attains a predetermined thickness.
申请公布号 US9252056(B2) 申请公布日期 2016.02.02
申请号 US201514793181 申请日期 2015.07.07
申请人 HAMAMATSU PHOTONICS K.K. 发明人 Fujii Yoshimaro;Fukuyo Fumitsugu;Fukumitsu Kenshi;Uchiyama Naoki
分类号 H01L21/00;H01L21/78;H01L21/304;H01L23/00 主分类号 H01L21/00
代理机构 Drinker Biddle & Reath LLP 代理人 Drinker Biddle & Reath LLP
主权项 1. A semiconductor chip manufacturing method wherein a silicon substrate having a plurality of circuit devices formed in a matrix on a front face of the silicon substrate is divided into the circuit devices to obtain semiconductor chips, the method comprising: irradiating the silicon substrate with laser light, thereby forming a plurality of modified regions embedded within the silicon substrate along each line of a plurality of cutting lines arranged in a grid running between the circuit devices which are adjacent to one another; reducing a thickness of the silicon substrate after forming the modified regions so that the silicon substrate is thinned so as to have a thickness not larger than 50 μm; and cutting the silicon substrate by reducing the thickness of the silicon substrate, or by fracture in the silicon substrate of which the thickness is reduced.
地址 Hamamatsu-shi, Shizuoka JP