发明名称 Semiconductor device and method for producing semiconductor device
摘要 A semiconductor device according to the present invention comprises a first pillar-shaped semiconductor layer, a gate insulating film formed around the first pillar-shaped semiconductor layer, a gate electrode made of a metal and formed around the gate insulating film, a gate line made of a metal and connected to the gate electrode, a second gate insulating film formed around an upper portion of the first pillar-shaped semiconductor layer, a first contact made of a second metal and formed around the second gate insulating film, a second contact which is made of a third metal and which connects an upper portion of the first contact to an upper portion of the first pillar-shaped semiconductor layer, a second diffusion layer formed in a lower portion of the first pillar-shaped semiconductor layer, a pillar-shaped resistance-changing layer formed on the second contact, a reset gate insulating film that surrounds the pillar-shaped resistance-changing layer, and a reset gate that surrounds the reset gate insulating film.
申请公布号 US9252190(B2) 申请公布日期 2016.02.02
申请号 US201414482750 申请日期 2014.09.10
申请人 UNISANTIS ELECTRONICS SINGAPORE PTE. LTD. 发明人 Masuoka Fujio;Nakamura Hiroki
分类号 H01L27/12;H01L31/113;H01L21/00;H01L21/336;H01L27/24;H01L45/00 主分类号 H01L27/12
代理机构 Brinks Gilson & Lione 代理人 Brinks Gilson & Lione
主权项 1. A semiconductor device comprising: a first pillar-shaped semiconductor layer; a gate insulating film around the first pillar-shaped semiconductor layer; a gate electrode made of a metal around the gate insulating film; a gate line made of a metal and connected to the gate electrode; a second gate insulating film around an upper portion of the first pillar-shaped semiconductor layer; a first contact made of a second metal and around the second gate insulating film; a second contact made of a third metal and which connects an upper portion of the first contact to an upper portion of the first pillar-shaped semiconductor layer; a diffusion layer in a lower portion of the first pillar-shaped semiconductor layer; a pillar-shaped resistance-changing layer on the second contact; a reset gate insulating film that surrounds the pillar-shaped resistance-changing layer; and a reset gate that surrounds the reset gate insulating film.
地址 Peninsula Plaza, Singapore SG