Capacitive test device and method for capacitive testing a component

摘要

A system and a method for capacitive testing a component (including a packaged component) are disclosed. An embodiment of a test head comprises a holding unit configured to pick-up, hold and release the component, an electrode configured to receive a capacitive signal from the component and a preamplifier configured to amplify the capacitive signal.

主权项

1. A test system for testing a component comprising:
a test tray configured to be loaded with a plurality of components; a loading board configured to load the components into the test tray from underneath the test tray; a plurality of pin fixtures configured to move towards the test tray and to provide signals to the components; a plurality of test heads configured to move towards the test tray and to receive capacitive signals of the components, wherein the pin fixtures and the test heads move from opposite sides to the test tray; and a controller configured to process the received capacitive signals.