发明名称 |
Methods and apparatuses for forming multiple radio frequency (RF) components associated with different RF bands on a chip |
摘要 |
A method includes forming a first gate oxide in a first region and in a second region of a wafer. The method further includes performing first processing to form a second gate oxide in the second region. The second gate oxide has a different thickness than the first gate oxide. The method also includes forming first gate material of a first device in the first region and forming second gate material of a second device in the second region. The first device corresponds to a first radio frequency (RF) band and the second device corresponds to a second RF band that is different from the first RF band. |
申请公布号 |
US9252147(B2) |
申请公布日期 |
2016.02.02 |
申请号 |
US201313958646 |
申请日期 |
2013.08.05 |
申请人 |
Qualcomm Incorporated |
发明人 |
Dutta Ranadeep;Yeap Choh Fei |
分类号 |
H01L29/76;H01L27/092;H01L21/8238;H01L21/8234;H01L27/088;H01L27/12;H03F3/195;H03F1/02;H03F3/24;H03F3/72 |
主分类号 |
H01L29/76 |
代理机构 |
Toler Law Group, PC |
代理人 |
Toler Law Group, PC |
主权项 |
1. A device comprising:
a first radio frequency (RF) component on a die, wherein the first RF component includes a first gate oxide having a first thickness, and wherein the first RF component is customized to operate in a first RF band associated with a first frequency; and a second RF component on the die, wherein the second RF component includes a second gate oxide having a second thickness that is less than the first thickness, and wherein the second RF component is customized to operate in a second RF band associated with a second frequency that is greater than the first frequency. |
地址 |
San Diego CA US |