发明名称 Nonvolatile semiconductor memory element, nonvolatile semiconductor memory, and method for operating nonvolatile semiconductor memory element
摘要 According to an aspect of the present invention, there is provided a nonvolatile semiconductor memory element including: a semiconductor substrate including: a source region; a drain region; and a channel region; a lower insulating film that is formed on the channel region; a charge storage film that is formed on the lower insulating film and that stores data; an upper insulating film that is formed on the charge storage film; and a control gate that is formed on the upper insulating film, wherein the upper insulating film includes: a first insulting film; and a second insulating film that is laminated with the first insulating film, and wherein the first insulating film is formed to have a trap level density larger than that of the second insulating film.
申请公布号 US9252290(B2) 申请公布日期 2016.02.02
申请号 US201514659266 申请日期 2015.03.16
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 Shingu Masao;Fujiki Jun;Yasuda Naoki;Muraoka Koichi
分类号 H01L29/78;H01L29/788;H01L21/28;H01L29/51;H01L29/792;G11C11/40;G11C16/04;G11C16/12;G11C16/14;G11C16/26;H01L27/115;H01L29/423;H01L29/49;G11C16/10 主分类号 H01L29/78
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A nonvolatile semiconductor memory comprising: a semiconductor film; a lower insulating film that is disposed on the semiconductor film; a conductive charge storage film that is disposed on the lower insulating film; an upper insulating film that is disposed on the conductive charge storage film and that has a four-or-more-layer structure; and a control gate that is disposed on the upper insulating film; wherein the upper insulating film includes: a first insulating film that is disposed on the conductive charge storage film;a second insulating film that is disposed on the first insulating film and that includes Hf; anda third insulating film that is disposed on the second insulating film;wherein a thickness of the first insulating film is less than a thickness of the third insulating film.
地址 Minato-ku JP