System for testing an integrated circuit of a device and its method of use

摘要

A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on a device, and a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals.

主权项

1. An apparatus for testing an integrated circuit of a device, comprising:
an apparatus frame; a cartridge including a common subassembly, including a cartridge frame, and a first unique contactor subassembly that is replaceable with a second unique contactor subassembly; a contactor interface on the contactor support structure; a connector interface having a surface for connecting to a surface of the contactor interface; a holder for the device, secured to the apparatus frame; a plurality of terminals held by the contactor support structure, the holder and contactor support structure being movable relative to one another so that each one of the terminals makes releasable contact with a respective contact of the device; a power source; a power electrical path connecting the power source to a power terminal of the terminals held by the support structure; a signal source; and a plurality of signal electrical paths, each connecting the signal source to a respective signal terminal of the terminals held by the support structure.