发明名称 |
Memory system and method of controlling nonvolatile memory |
摘要 |
According to an embodiment, a controller specifies a first voltage range that has a first distribution quantity, a second voltage range that is adjacent to a lower voltage side of the first voltage range, and a third voltage range that is adjacent to a higher voltage side of the first voltage range. The first distribution quantity is a minimum value of the memory cells. The controller determines a read voltage by using the first voltage range, a first representative voltage value in the first voltage range, the first distribution quantity, a second distribution quantity corresponding to the second voltage range, and a third distribution quantity corresponding to the third voltage range. |
申请公布号 |
US9251892(B1) |
申请公布日期 |
2016.02.02 |
申请号 |
US201514636685 |
申请日期 |
2015.03.03 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
Asami Shohei;Hida Toshikatsu;Hara Tokumasa;Suzuki Riki |
分类号 |
G11C11/34;G11C16/04;G11C11/56 |
主分类号 |
G11C11/34 |
代理机构 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
代理人 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
主权项 |
1. A memory system comprising:
a nonvolatile memory that includes a plurality of memory cells, each of the memory cells having a storage capacity of N bits in accordance with 2 to the power of N threshold voltage distributions, where N is a natural number that is equal to or greater than 1; and a controller configured to
read data from the plurality of memory cells by using four voltage values,associate three voltage ranges designated by the four voltage values with a number of the memory cells using the four voltage values,specify, from the three voltage ranges, a first voltage range, a second voltage range, and a third voltage range, the first voltage range having a first distributed number of memory cells, the first distributed number of memory cells being a minimum value of the memory cells, the second voltage range being adjacent to a lower voltage side of the first voltage range, the third voltage range being adjacent to a higher voltage side of the first voltage range,determine a read voltage by using the first voltage range, a first representative voltage value in the first voltage range, the first distributed number of memory cells, a second distributed number of memory cells, and a third distributed number of memory cells, the second distributed number of memory cells being a number of memory cells corresponding to the second voltage range, the third distributed number of memory cells being a number of memory cells corresponding to the third voltage range, andread the data from the nonvolatile memory by using the determined read voltage. |
地址 |
Minato-ku JP |