发明名称 |
Methods for a phase-change memory array |
摘要 |
Methods of operating phase-change memory arrays are described. A method includes determining a pattern to be written to a phase-change memory array and executing, according to the pattern, two or more proper reset sequences on the phase-change memory array to write the pattern to the phase-change memory array. Another method includes executing a set sequence on a phase-change memory array and performing a proper read of the phase-change memory array to obtain a pattern derived from executing the set sequence. |
申请公布号 |
US9251897(B2) |
申请公布日期 |
2016.02.02 |
申请号 |
US200913518361 |
申请日期 |
2009.12.31 |
申请人 |
Micron Technology, Inc. |
发明人 |
Bedeschi Ferdinando;Resta Claudio;Ferraro Marco |
分类号 |
G11C11/00;G11C13/00;H01L45/00;G11C13/02 |
主分类号 |
G11C11/00 |
代理机构 |
Schwegman Lundberg & Woessner, P.A. |
代理人 |
Schwegman Lundberg & Woessner, P.A. |
主权项 |
1. A method of operating a phase-change memory array, the method comprising:
defining a starting condition for each cell in the phase-change memory array prior to storing a plurality of bits in the phase-change memory array, the starting condition being defined by providing either hard reset pulses or soft reset pulses to each of the cells in the phase-change memory array; determining a pattern to be written to the phase-change memory array, the pattern comprising both real data bits having sensitive information to be stored and data bits having a state that is unimportant to the sensitive information to be stored; and writing the pattern to the phase-change memory array. |
地址 |
Boise ID US |