发明名称 Method for processing structure in manufacturing semiconductor device
摘要 A method used for processing a structure in manufacturing of a semiconductor device may include polishing the structure to form a polished structure. The polished structure may include a metal member, a dielectric layer that contacts the metal member, and a particle that contacts at least one of the metal member and the dielectric layer. The method may further include applying an organic acid to the polished structure to remove at least a portion of the particle. The particle may be substantially removed, such that satisfactory quality of the semiconductor may be provided.
申请公布号 US9252010(B2) 申请公布日期 2016.02.02
申请号 US201414180227 申请日期 2014.02.13
申请人 SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION 发明人 Jiang Lily;Li Cindy
分类号 H01L21/302;H01L21/461;H01L21/02 主分类号 H01L21/302
代理机构 Innovation Counsel LLP 代理人 Innovation Counsel LLP
主权项 1. A method for processing a structure in manufacturing of a semiconductor device, the method comprising: polishing the structure to form a polished structure, the polished structure comprising a first metal member, a dielectric layer that contacts the first metal member, and a particle that contacts at least one of the first metal member and the dielectric layer; applying a first organic acid to the polished structure to remove at least a first portion of the particle, and applying a second organic acid to remove a second portion of the particle, wherein the first organic acid is applied in a solution polishing process to remove the first portion of the particle, wherein the second organic acid is used in a chemical cleaning process to remove the second portion of the particle, and wherein the chemical cleaning process is performed after the solution polishing process.
地址 CN