发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING DEVICE AND PROGRAM |
摘要 |
PROBLEM TO BE SOLVED: To suppress the generation of an incubation time and the formation of a transition layer when a deposition process is performed on an insulation film.SOLUTION: A film including a first element and a second element is formed on a surface of an insulation film having been subjected to preprocessing by performing cycles for a predetermined number of times, each cycle non-simultaneously performing the steps of: subjecting a surface of the insulation film to the preprocessing by supplying raw materials including the first element and a halogen element to a substrate having a surface on which the insulation film has been formed; supplying the raw materials to the substrate; and supplying a reactant including the second element to the substrate.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016018907(A) |
申请公布日期 |
2016.02.01 |
申请号 |
JP20140141089 |
申请日期 |
2014.07.09 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
HASHIMOTO YOSHITOMO;HIROSE YOSHIRO;HARADA KATSUYOSHI;NAKAMURA YOSHINOBU;SASAJIMA RYOTA |
分类号 |
H01L21/318;C23C16/455;H01L21/31;H01L21/316 |
主分类号 |
H01L21/318 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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