发明名称 |
QUANTITATIVE ANALYSIS SYSTEM AND QUANTITATIVE ANALYSIS METHOD OF HALOGEN AND SULFUR |
摘要 |
PROBLEM TO BE SOLVED: To provide a quantitative analysis system detecting impurities of low concentration in a sample with high sensitivity.SOLUTION: A quantitative analysis system of this invention includes a meter for weighting a sample, and an analysis device for quantitating an element contained in the weighted sample. The analysis device has a sample input unit for inputting the sample. The quantitative analysis system includes a clean booth surrounding one or both of the sample input unit and the meter, and a clean air supply unit for supplying into the clean booth a gas in which a contamination component and fine powder are removed.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016017665(A) |
申请公布日期 |
2016.02.01 |
申请号 |
JP20140139498 |
申请日期 |
2014.07.07 |
申请人 |
SUMIKA CHEMICAL ANALYSIS SERVICE LTD |
发明人 |
SATO HISAKO;MATSUURA YUJI;UEDA KAZUHIRO;IIKAWA REIKO |
分类号 |
F24F7/06;G01N1/00 |
主分类号 |
F24F7/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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