发明名称 QUANTITATIVE ANALYSIS SYSTEM AND QUANTITATIVE ANALYSIS METHOD OF HALOGEN AND SULFUR
摘要 PROBLEM TO BE SOLVED: To provide a quantitative analysis system detecting impurities of low concentration in a sample with high sensitivity.SOLUTION: A quantitative analysis system of this invention includes a meter for weighting a sample, and an analysis device for quantitating an element contained in the weighted sample. The analysis device has a sample input unit for inputting the sample. The quantitative analysis system includes a clean booth surrounding one or both of the sample input unit and the meter, and a clean air supply unit for supplying into the clean booth a gas in which a contamination component and fine powder are removed.SELECTED DRAWING: Figure 1
申请公布号 JP2016017665(A) 申请公布日期 2016.02.01
申请号 JP20140139498 申请日期 2014.07.07
申请人 SUMIKA CHEMICAL ANALYSIS SERVICE LTD 发明人 SATO HISAKO;MATSUURA YUJI;UEDA KAZUHIRO;IIKAWA REIKO
分类号 F24F7/06;G01N1/00 主分类号 F24F7/06
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