发明名称 SHORT-CIRCUIT TEST DEVICE AND SHORT-CIRCUIT TEST METHOD
摘要 PROBLEM TO BE SOLVED: To provide a short-circuit test device capable of forming an internal short circuit in a power storage device simply and with high quality, and a short-circuit test method using the short-circuit test device.SOLUTION: A short-circuit test device forcibly causes an internal short circuit by inserting a rod-like member into a power storage device. The rod-like member comprises: a body forming part having an internal space extending in a longitudinal direction and having electrical insulation properties on the surface; and an end forming part disposed on one end side of the body forming part and having a through hole that passes through the internal space and an external space. A conductor is melted by the end forming part and is led to the outside via the end forming part.SELECTED DRAWING: Figure 1
申请公布号 JP2016018722(A) 申请公布日期 2016.02.01
申请号 JP20140141686 申请日期 2014.07.09
申请人 MITSUBISHI MOTORS CORP 发明人 SHIRATORI AKIO
分类号 H01M10/48;H01M10/42 主分类号 H01M10/48
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