| 摘要 |
The present invention relates to equipment for testing electronic parts for a semiconductor device. According to the present invention, the equipment for testing electronic parts for a semiconductor device comprises: a delivery moving unit for moving a loading tray coming from equipment combined with the front end to a position of delivery; a tester for testing electronic parts loaded on the loading tray delivered by the delivery moving unit; a shipping moving unit for shipping the loading tray with the electronic parts, whose test is completed by the tester, loaded toward the equipment combined with the rear end; and, a moving picker for moving the loading tray at the position of delivering by the delivery moving unit, electrically connecting the electronic parts loaded on the loading tray to the tester, and moving the loading tray with the electronic parts, whose test is completed by the tester, loaded to the position of taking out by the shipping moving unit. According to the present invention, proposed is a new equipment which can relay a loading tray in between equipment combined with the front end and equipment combined with the rear end, can test the electronic parts whose production process is completed at the equipment combined with the front end, and can send the electronic parts to the equipment combined with the rear end. |
