发明名称 |
METHOD FOR INTRODUCING IMPURITY, DEVICE FOR INTRODUCING IMPURITY AND METHOD FOR MANUFACTURING SEMICONDUCTOR ELEMENT |
摘要 |
PROBLEM TO BE SOLVED: To increase a penetration depth of an impurity element, in the case where laser doping is performed using an impurity element in a solution.SOLUTION: A method for introducing impurities includes the steps of bringing a solution 4 containing an impurity element into contact with the top of a main surface 2a of a semiconductor substrate 2, and irradiating the main surface 2a of the semiconductor substrate 2 with a laser beam 32 via the solution 4 to raise the temperature of the main surface of the semiconductor substrate 2 at an irradiation position P of the laser beam 32. In the method, the laser beam 32 is applied in a mode where the irradiation is repeated so that the raised temperature does not return to room temperature or in a mode where the raised temperature is kept at a constant temperature, and the impurity element is introduced into a part of the inside of the semiconductor substrate 2.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016018816(A) |
申请公布日期 |
2016.02.01 |
申请号 |
JP20140138889 |
申请日期 |
2014.07.04 |
申请人 |
FUJI ELECTRIC CO LTD |
发明人 |
NAKAZAWA HARUO;IGUCHI KENICHI;OGINO MASAAKI |
分类号 |
H01L21/22;B23K26/064;B23K26/08;C30B31/04;H01L21/228;H01L21/268 |
主分类号 |
H01L21/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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