发明名称 MEASURING MICROSCOPE AND METHOD FOR SUPPORTING CORRECTION OF TILT OF SAMPLE
摘要 PROBLEM TO BE SOLVED: To provide a technique for manually correcting the tilt of a sample with ease.SOLUTION: A measuring microscope 100 includes a rotary stage 203, a XY stage 204, an operating unit 310, and a display control unit 320. The rotary state 203 has a rotary shaft parallel to an optical axis of an objective lens 201 and is rotated by manual operation. The XY stage 204 is a linear stage moving the rotary stage 203 into a specific direction perpendicular to the optical axis of the objective lens 201. The operating unit 310 calculates the tilt of a sample S with respect to a predetermined direction, and the display control unit 320 causes a display 400 to display information on the tilt of the sample S on the basis of the tilt calculated by the operating unit 310.SELECTED DRAWING: Figure 1
申请公布号 JP2016017800(A) 申请公布日期 2016.02.01
申请号 JP20140139637 申请日期 2014.07.07
申请人 OLYMPUS CORP 发明人 HOSONO SHOTA
分类号 G01B9/04;G01B11/26;G02B21/26;G02B21/36 主分类号 G01B9/04
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