发明名称 THERMIONICALLY-OVERDRIVEN TUNNEL FETS AND METHODS OF FABRICATING THE SAME
摘要 A field effect transistor (FET) is provided. The FET includes: a nanosheet stack having a first channel layer which defines a channel region of a tunnel FET, and a second channel layer which defines a channel region of a thermionic FET; source and drain regions extended between the first and second channel layers in both sides of the nanosheet stack. A first portion of the source region adjacent to the first channel layer and a second portion of the source region adjacent to the second channel layer have opposite semiconductor conductivity types.
申请公布号 KR20160011171(A) 申请公布日期 2016.01.29
申请号 KR20150103027 申请日期 2015.07.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 RODDER MARK S.;OBRADOVIC BORNA J.;BOWEN ROBER C.;PALLE DHARMENDAR REDDY
分类号 H01L29/73;H01L21/265;H01L29/06 主分类号 H01L29/73
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