发明名称 |
THERMIONICALLY-OVERDRIVEN TUNNEL FETS AND METHODS OF FABRICATING THE SAME |
摘要 |
A field effect transistor (FET) is provided. The FET includes: a nanosheet stack having a first channel layer which defines a channel region of a tunnel FET, and a second channel layer which defines a channel region of a thermionic FET; source and drain regions extended between the first and second channel layers in both sides of the nanosheet stack. A first portion of the source region adjacent to the first channel layer and a second portion of the source region adjacent to the second channel layer have opposite semiconductor conductivity types. |
申请公布号 |
KR20160011171(A) |
申请公布日期 |
2016.01.29 |
申请号 |
KR20150103027 |
申请日期 |
2015.07.21 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
RODDER MARK S.;OBRADOVIC BORNA J.;BOWEN ROBER C.;PALLE DHARMENDAR REDDY |
分类号 |
H01L29/73;H01L21/265;H01L29/06 |
主分类号 |
H01L29/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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