发明名称 SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND INFRARED SENSOR
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device that suppresses the deterioration of an S/N ratio.SOLUTION: The present invention provides a semiconductor device having a multilayer substrate in which a support substrate and an insulating film are layered, wherein the semiconductor device has: an integrated circuit formed on the multilayer substrate; a wiring layer formed in the insulating film; an electrode opening, formed on the wiring layer, for supplying ground potential to the support substrate; a connection hole formed near the electrode opening and extending from the face of the wiring layer where the electrode opening is formed to the support substrate; and a conductive material formed in shape of a film in an area that includes the surfaces of the electrode opening and connection hole, the conductive material electrically connecting the support substrate and the electrode opening.
申请公布号 JP2016014627(A) 申请公布日期 2016.01.28
申请号 JP20140137692 申请日期 2014.07.03
申请人 RICOH CO LTD 发明人 NAGAHISA TAKESHI;ANDO YUICHI;KATO HIDEKI;NOGUCHI EIGO;MASUO HIDEKAZU;HOSHINO YUTARO
分类号 G01J1/02 主分类号 G01J1/02
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