发明名称 METHOD OF AND APPARATUS FOR CMP PAD CONDITIONING
摘要 A chemical mechanical polishing (CMP) apparatus is provided that includes a conditioning disc for conditioning a polishing pad of the CMP apparatus. The conditioning disc includes a plurality of portions of subsystem discs. The portions may be regions of the disc that are concentric. Each portion of the disc is operable to rotate at a different angular velocity. In some embodiments, a different applied loading is provided to each of the portions of the disc in addition to or in lieu of the different angular velocities.
申请公布号 US2016023324(A1) 申请公布日期 2016.01.28
申请号 US201514875410 申请日期 2015.10.05
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Yeh Hsiu-Ming;Wu Feng-Inn
分类号 B24B53/017;H01L21/306 主分类号 B24B53/017
代理机构 代理人
主权项 1. A method, comprising: providing a conditioning disc for conditioning a polishing pad of a chemical mechanical polish (CMP) apparatus, wherein the conditioning disc includes a first subsystem disc and a concentric second subsystem disc; providing a dresser head coupled to the conditioning disc, wherein a first portion of the dresser head and the first subsystem disc define a first integral piece, and wherein a second portion of the dresser head and the second subsystem disc define a second integral piece; applying, by a controller in communication with the dresser head, a first force to the first subsystem disc using the integral first portion of the dresser head; and applying, by the controller in communication with the dresser head, a second force to the second subsystem disc using the integral second portion of the dresser head while applying the first force, the second force being different than the first force.
地址 Hsin-Chu TW