发明名称 |
METHOD OF AND APPARATUS FOR CMP PAD CONDITIONING |
摘要 |
A chemical mechanical polishing (CMP) apparatus is provided that includes a conditioning disc for conditioning a polishing pad of the CMP apparatus. The conditioning disc includes a plurality of portions of subsystem discs. The portions may be regions of the disc that are concentric. Each portion of the disc is operable to rotate at a different angular velocity. In some embodiments, a different applied loading is provided to each of the portions of the disc in addition to or in lieu of the different angular velocities. |
申请公布号 |
US2016023324(A1) |
申请公布日期 |
2016.01.28 |
申请号 |
US201514875410 |
申请日期 |
2015.10.05 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Yeh Hsiu-Ming;Wu Feng-Inn |
分类号 |
B24B53/017;H01L21/306 |
主分类号 |
B24B53/017 |
代理机构 |
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代理人 |
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主权项 |
1. A method, comprising:
providing a conditioning disc for conditioning a polishing pad of a chemical mechanical polish (CMP) apparatus, wherein the conditioning disc includes a first subsystem disc and a concentric second subsystem disc; providing a dresser head coupled to the conditioning disc, wherein a first portion of the dresser head and the first subsystem disc define a first integral piece, and wherein a second portion of the dresser head and the second subsystem disc define a second integral piece; applying, by a controller in communication with the dresser head, a first force to the first subsystem disc using the integral first portion of the dresser head; and applying, by the controller in communication with the dresser head, a second force to the second subsystem disc using the integral second portion of the dresser head while applying the first force, the second force being different than the first force. |
地址 |
Hsin-Chu TW |