IMPROVEMENTS RELATING TO TEST DEVICES

摘要

The invention relates to test devices such as diagnostic test devices. In particular the invention relates to individually packaged test devices. The invention also relates to methods of manufacturing such individually packaged test devices, use of such individually packaged test devices, and test device cards comprising two or more test devices. In particular, the invention relates to a test device comprising: a test strip having first and second major surfaces and comprising: a proximal portion for bearing contacts for a metering device, an intermediate portion for receiving a sample comprising a test area on the first major surface, the test area comprising at least one test component; a separable distal portion; and in which the test device further comprises: a cover leaf (optionally a removable cover leaf) having a portion (optionally a removable portion) extending over at least part of one of the major surfaces of the test strip so as to seal the test area and having a non-removable portion attached to the separable distal portion of the test strip.

主权项

1. A test device comprising:
a test strip having first and second major surfaces and comprising:
a proximal portion for bearing contacts for a metering device,an intermediate portion for receiving a sample comprising a test area on the first major surface, the test area comprising at least one test component;a separable distal portion, wherein the separable distal portion is separable so as to be movable with respect to at least the intermediate portion; and in which the test device further comprises:
at least one removable cover leaf comprising a moisture barrier layer, the at least one removable cover leaf having a removable portion extending over at least part of one of the major surfaces of the test strip so as to seal the test area by restricting moisture ingress via the at least part of the major surface; and, the at least one removable cover leaf having a non-removable portion attached to the separable distal portion of the test strip.