发明名称 MICROSCOPE HAVING CORRECTION UNIT FOR CORRECTING A VARIABLE SPHERICAL ABERRATION
摘要 The invention relates to a microscope (21, 40, 60) having at least one correction unit (10), arranged in a beam path, for correcting a variable spherical aberration. The correction unit (10) comprises at least one optical correction element (12) that is moveably arranged along the optical axis (O) in a convergent or divergent region (14) of the beam path. The optical correction element (12) has a correction surface (18), the part of which that is passed through by the convergent or divergent region (14) of the beam path forming a correctionally effective surface section (20), the radial expansion of which can be altered across the optical axis (O) by moving the correction element (12) along the optical axis (O).
申请公布号 WO2016012450(A1) 申请公布日期 2016.01.28
申请号 WO2015EP66649 申请日期 2015.07.21
申请人 LEICA MICROSYSTEMS CMS GMBH 发明人 SCHULZ, CHRISTIAN;SCHUMANN, CHRISTIAN;GONSCHIOR, CORNELL;BAUER, TOBIAS
分类号 G02B21/00;G02B27/00 主分类号 G02B21/00
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