发明名称 VELOCITY TRANSITION MEASURING DEVICE AND VELOCITY TRANSITION MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To improve measuring accuracy for a transition in a surface velocity.SOLUTION: A velocity transition measuring device comprises: a laser driver 4 oscillating a semiconductor laser 1; a calculation unit 7 calculating a run length of a binary signal obtained by binarizing an interference waveform contained in an output from a photodiode 2 converting an output from the semiconductor laser 1 to an electric signal; and an arithmetic unit 8 computing a transition in a surface velocity of a web 11 from a calculation result of the calculation unit 7. The calculation unit 7 binarizes the interference waveform synchronously with a sampling clock, measures the run length of the binary signal in each of a reference period and a comparison period, creates a run length frequency distribution for each of the reference period and the comparison period, and calculates a total number of run lengths equal to or higher than a threshold Th for each of the reference period and the comparison period from the frequency distribution.
申请公布号 JP2016014616(A) 申请公布日期 2016.01.28
申请号 JP20140137380 申请日期 2014.07.03
申请人 AZBIL CORP 发明人 UENO TATSUYA
分类号 G01S17/58;G01P3/36;G01S17/32 主分类号 G01S17/58
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